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DOI:
工程科学与技术:2007,39(5):149-154
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模拟VLSI电路故障诊断的子带特征提取方法
(电子科技大学 自动化工程学院,四川 成都 610054)
Subband Signature Extraction for Fault Diagnosis ofAnalog VLSI Circuits
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投稿时间:2007-03-06    
中文摘要: 为了降低模拟电路参数型故障的测试难度,提出了一种基于奥克塔夫(Octave) Haar小波结构的模拟VLSI电路故障诊断方法。将测试响应经小波滤波器组完成子带滤波,随后对各子带滤波序列计算故障子序列与正常子序列的互相关系数, 对每一故障,可确定出互相关系数最小的子带,并将此数值作为该故障的特征, 对应子带的正常响应序列的自相关系数作为无故障特征,用故障特征与正常特征的对比可诊断故障。对国际标准电路的实验表明,该方法对参数型故障的诊断已具有高分辨率。
Abstract:An approach for diagnosing analog VLSI circuits based on Octave Haar wavelet was presented in order to lower the difficulty level of testing analog parametric fault. Sub-band filtering of testing response signal was accomplished by wavelet filter banks. The cross-correlation coefficient(CCC) was computed to sequence acquired from sub-band filtering. Consequently, for each fault, subband with lowest CCC value was determined and this value could be used as faulty signature for this fault, and auto-correlation coefficient of normal response in corresponding sub-band was referred to as fault-free signature. Hence, fault diagnosis can be finished by comparing the faulty signature with its fault-free counterpart. Experiments of international Benchmark circuit showed that methodology had high precision for diagnosing parametric fault.
文章编号:20070529     中图分类号:    文献标志码:
基金项目:国家自然科学基金资助项目(90407007)
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引用文本:
谢永乐,李西峰.模拟VLSI电路故障诊断的子带特征提取方法[J].工程科学与技术,2007,39(5):149-154.
.Subband Signature Extraction for Fault Diagnosis ofAnalog VLSI Circuits[J].Advanced Engineering Sciences,2007,39(5):149-154.