Zheng Mei,Xiao Xianyong,Chen Yunzhu,et al.Fault sample augmentation and maximum entropy modeling for probability assessment of sensitive equipment due to voltage sags[J].Advanced Engineering Sciences,2024,56(2):68–79
Zheng Mei,Xiao Xianyong,Chen Yunzhu,et al.Fault sample augmentation and maximum entropy modeling for probability assessment of sensitive equipment due to voltage sags[J].Advanced Engineering Sciences,2024,56(2):68–79 DOI: 10.15961/j.jsuese.202300976.
Fault Sample Augmentation and Maximum Entropy Modeling for Probability Assessment of Sensitive Equipment Due to Voltage Sags